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After the investment of time and money that you’ve put into selecting the best handler to meet your IC test requirements, guarantee your success by choosing the best change kit components available. DB Design is the leading independent provider of pick-and-place handler change kits around the world. We have helped hundreds of customers test thousands of device types, in all shapes and sizes. Whether you’re testing simple TSOPs and QFPs or more complex µBGAs, CSPs and MCMs, you can rely on DB Design’s experience for timely, reliable and cost-effective test interface solutions.
An IC device change kit allows an automatic test handler to accommodate different device sizes and package types. Each kit is a collection of precision fixtures that physically move semiconductor devices through the test handler, present them to the socket/contactor for test and then transport them into the appropriate sorting bin.
DB Design provides change kits for pick-and-place handlers from the following manufacturers:
- Aetrium (Advantek)
- Aseco
- Delta Design
- Hyac (JLSI Tesam)
- Multitest
- Seiko Epson
- Synax
DB Design Group offers the Vac-Lock™ Docking System for test floor equipment docking. Hard docking is often required between the test head and device handler or wafer prober. Vac-Lock features a universal footprint, precision positioning and positive locking to permit complete interconnectivity between the test floor equipment. Using Vac-Lock, operators can now quickly dock and un-dock any tester on the test floor with any handler or prober, eliminating the cables and cams of older solutions that "wedge" the equipment together. Setup time is significantly reduced and physical strain on the operator is virtually eliminated, improving test floor productivity and reducing the time and cost of test.
Vac-Lock
has been successfully installed on numerous test systems, including those
from Teradyne, Agilent, Credence, Seiko Epson, Delta Design, Trillium,
Synax, JLSI Tesam (Hyac), Aseco, Aetrium, TMT, TSK and TEL.
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The
New Vac-Lock™ IQ
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Manipulators
For
those test managers who have selected to use smaller, more flexible test
heads on their floors, DB Design now offers the versatility and reliability
of its new Mobile Manipulator™. Designed for compact ATE testers,
the Mobile Manipulator provides quick, convenient and efficient docking
between test heads and automated handlers and probers. No longer must
the handlers and probers be moved to the testers - now the testers can
move wherever they're needed.
Integrated circuit receptacles from DB Design allow for the quick and easy exchange of sockets without costly damage of desoldering them from the load boards. Since sockets wear out more quickly than boards or receptacles, all leading semiconductor manufacturers and test houses use receptacles to protect the boards and extend their life.
DB Design receptacles are engineered to exacting standards to handle practically any device (BGA µBGA, LGA, CSP, etc.) and to mate with practically any test or burn-in socket from Yamaichi, Enplas, Nepenthe, Plastronics, TI, 3M/Textool or Wells-CTI. DB Design’s receptacles utilize the best contacts and materials available and are compatible with socket pitch patterns as dense as 0.50mm.
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1137 Cadillac Court, Milpitas, CA 95035
408-263-7500 • fax 408-263-7373 • info@dbdesign.com